Crystal Growth Centre - Anna University
 
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Facilities

SOPHISTICATED CHARACTERIZATION EQUIPMENT

(To avail the facility, contact Prof.K. Baskar, Director, Crystal Growth Centre, Anna University, Chennai.)

Sl. No

Name of the Equipment

Specification/
Features/ make of the equipment


Uses  of the equipment

 


User form

1

Atomic Force Microscope (AFM)

Park XE-100

Contact AFM, Non-contact AFM, Intermittent / Dynamic/ Tapping Mode, Magnetic Force Microscopy, Low-current  Conductive AFM / Low current STM (noise level <3pAmp or better, gain: 103 to 109 V/A or better) and I-V spectroscopy, 5 μm XY scanner, Electrostatic Force microscopy to measure electrical properties.

 

AFM  Pdf  file

2

SPM coupled Nanoindenter

Hysitron TI950 Triboindenter

Nanomechanical Characterization of ultra thin films, nanobiomaterials
(only for Epitaxial Films)


SPM coupled Nanoindenter Pdf file

3

Scanning Electron Microscope with EDS

Carl Zeiss
MA15 / EVO 18 Scanning Electron Microscope

 

 

 

Oxford Instruments NanoAnalysis
INCA Energy 250 Microanalysis System (EDS)

Scanning electron microscope with graphical user interface (GUI), digital image store and image processor, monitor, large specimen chamber, 5-axis motorised stage, SE-detector,  and fail-safe vacuum system with oil-free turbo molecular pump.

  • Resolution 3.0 nm at 30 kV with SE detector

Resolution 4.5 nm at 30 kV in Low vacuum mode by BSD

  • Tungsten hairpin filament

Magnification- 5x to 1,000,000x
Sputter Coater
Inca 250 EDS with 130eV INCAx-act Peltier cooled Analytical SDD
 Detector with PentaFET® Precision having capability of Quantitative, Qualitative, mapping, Point & ID etc. including cobolt standard on pin stub

 

SEM Pdf file

 

EDX Pdf file

4

Powder X-Ray Diffractometer

PANalytical
X’Pert Powder XRD System

  • Standard Phase Analysis and Phase Identification for Powders with the ICDD database.
  • Flat Sample Stage for mounting powder samples and thin film samples.
  • Fixed Divergent Slits.
  • Programmable Receiving Slits.
  • Fixed Anti scatter slits.
  • Proportional Counter detector
  • Phase quantification by Calibration and Standardless RIR method in various types of specimens.
  • HiScore Plus Software
  • Monochromator for Sealed Xe Proportional Counter detector
  • Spinning Sample Stage – Unique Reflection cum Transmission Sample Spinner Stage for powder samples with preferred orientation, thin film characterisation of Single and Multi -Layered Polycrystalline Thin Films, Stress Measurements and SAXS measurements, Analysis of air sensitive samples. With controlled Phi rotation
  • SAXS Software


Powder-XRD PDF file

5

High Resolution
 X-Ray diffraction  (HRXRD)

 PANalytical
X-Pert Pro MRD  Resolution
0.0001° /0.36 arcsec
Ge- (220) monochromator
Triple axis (Xe) detector
Pixel detector 

Gonio and 2θ scan(peak position ), omega scan(Crystalline quality ), omega-2qscan(composition and thickness), Reflectivity (thickness and roughness) RSM (Lattice mismatch and strain) Chi and Phi scan

 


HRXRD Pdf file

6

FTIR  Spectrometer

JASCO  INTERNATIONAL CO. / JAPAN
FOURIER TRANSFORM INFRARED SPECTROMETER
MODEL FTIR-6300

Wave number Range: 7,800 - 350 cm-1
Resolution:0.07cm-1
Demountable Liquid cell with  NaCl windows
SINGLE REFLECTION ATR Model: ATR PRO470-H; ATR Crystal : Diamond
ATR PRO 410 –M MULTIPLE REFLECTION ATR ACCESSORY
CRYSTAL MATERIAL : ZnSe

INFRA RED MICROSCOPE UPGRADABLE TO MULTICHANNEL / ARRAY DETECTOR
IRT-5000-32 INFRARED MICROSCOPE X32 CASSEGRAIN
Standard detector: Single wide-band MCT (7800 – 450 cm-1)
ATR-5000-Z  ATR Objective with ZnSe prism

 

FTIR Form1 pdf file

7

Photo-luminescence  (PL)

Spectra physics  Argon ion-488nm  and 514nm  tunable laser Wave train for doubling the wavelength of 488nm (244nm UV laser )
Horiba jobin Monochromator  330nm and 550 nm PMT detector

Emission spectrum, defect analysis, and Band gap of the  materials 

 

 

PL Pdf file

8

Portable Laser Raman Spectrometer

Raman Systems
200-1000 Cm-1

Raman Analysis of Crystals, Pellets


Raman Spectrometer
Pdf file

9

Fluorimeter

JASCO Make
Emission Range : 200-750 nm

Fluorescence Analysis of Crystals, Pellets


Fluorimeter Pdf File

10

Integrated measurement system

IMS-2000

IV and CV measurements

 

11

Dynamic Light Scattering

ZEN3600

He – Ne laser ( 633 nm),              size range – 0.3 nm to 10 µm, Conductivity range:0 to 200 mS/cm, Molecular weight range: 342 Da to 2x107Da                          Temperature range: 0 0 C to 90 0C
VIS5001Minimum sample volume – 1 mL, fluid viscosity - 0.3 to 10,000mPa.s

Particle size measurement and size distribution of particles in emulsions and molecules dispersed or dissolved in a liquid.

To determine the molecular weight of proteins.

To determine the zeta potential of the colloidal suspension.

 

 

Dynamic Light Scattering Pdf File

12

Metrological Optical Microscope

Carl Zeiss Aixoscope
Reflected and Transmitted light illumination. Magnification 50x-1000x

Bright and Dark field and Differential interference contrast (DIC) studies


Metrological Optical Microscope Pdf file

13

Optical Stereo Microscope

Stereo discovery V8
Magnification – 460 X
Halogen lamp – 15 V – 150 W
Transmitted light with bright/dark field and variable oblique light

Used to study the surface morphology of solid, crystals, circuit board, biological specimens.

Optical Stereo Microscope Pdf file

14.

DC Polling Unit

Field : 50kV/cm Resolution 1% Input 220 V AC50 Hz

To poll the dipoles for ferro electric characterization


DC Polling Unit Pdf file


The following facilities can be useful to many Industries. The samples can be tested or evaluated on payment basis

 

  • Metal Organic Chemical Vapour Deposition (MOCVD) system

  • Scanning Electron Microscope with EDX for Elemental Analysis

  • X-ray Diffraction Spectrometer with Orientation Goniometer

  • UV-Visible Spectrophotometer

  • High Temperature Furnaces

  • Autoclaves

  • Thin Film Coating Units

  • Electrocrystallisation unit

  • Crystal Pullers

  • Low temperature crystal growth units

  • Liquid Phase Epitaxy and Vapour Phase Epitaxy Systems

  • Optical Microscope

  • Cutting and Polishing Machine

 

 
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